A polishing fixture and a polishing system

ABSTRACT

A polishing fixture and a polishing system are disclosed. The polishing fixture includes a supporting platform, and an operating platform detachably and fixedly connected to the supporting platform. The operating platform includes at least two locating pins, the supporting platform and the operating platform are fixedly connected together to form a placement platform for the product to be polished. The object of the present invention is to provide a polishing fixture and a polishing system, after hundreds of products are fixed by the polishing fixture, the polishing equipment is capable of polishing hundreds of products at one time, which improves the polishing efficiency and reduce the rejection rate of the polishing products at the same time, and the rejection rate is as low as about three per thousand.

CROSS REFERENCE TO RELATED APPLICATIONS

This application claims priority of Chinese Patent Application No. 201811609681.6, filed Dec. 27, 2018, the entire contents of which are incorporated herein by reference.

FIELD OF THE INVENTION

The disclosure relates to the field of polishing, and particularly relates to a polishing fixture and a polishing system.

DESCRIPTION OF THE PRIOR ART

The manufacturing process of the light guide plate comprises the following steps: cutting a substrate (generally being optical acrylic or PC plate) into fixed sizes, then polishing the substrate to an accurate size, and finally printing a light guide screen dot structure on the bottom surface of the substrate by using the technologies of laser engraving, V-shaped cross grid engraving, UV screen printing, etc.

The traditional polishing technology is to stack up the light guide substrates, and then process the light guide substrates which are fixed by baffle. As shown in FIG. 3, because the light guide substrates are provided with bosses with the height of about 1 mm, the stacked light guide substrates are easy to tilt, resulting in processing only a small number of products at a time. And because the length and width of the polishing products requires high accuracy, the rejection rate of the products is relatively high. Generally, the rejection rate of processing ten light guide substrates is 40%-50%, with low polishing efficiency and high rejection rate, the production requirement cannot be satisfied.

How to improve the polishing efficiency and reduce the rejection rate at the same time has become an urgent problem to be solved at present.

SUMMARY OF THE INVENTION

The present invention aims to overcome the shortage of prior art, to solve the problems exiting in the prior art, and to provide a polishing fixture and a polishing system. After hundreds of products are fixed by the polishing fixture, the polishing equipment is capable of polishing hundreds of products at one time, which improves the polishing efficiency and reduce the rejection rate of the polishing products at the same time, and the rejection rate is as low as about three per thousand.

The technical scheme of the present invention provides a polishing fixture, including a supporting platform, and an operating platform detachably and fixedly connected to the supporting platform. The operating platform includes at least two locating pins, the supporting platform and the operating platform are fixedly connected together to form a placement platform for the product to be polished.

Preferably, further including a lifting support platform fixedly connected to the bottom of the operating platform, and a lifting device arranged on the lifting support platform. The lifting device is used to control the locating pins moving back and forth along the vertical direction of the operating platform, so as to control the height of the locating pins on the operating platform. One end of each locating pin is fixed on the lifting device, and the other end is threaded through the top surface of the operating platform.

Preferably, the lifting device includes a guide rod, a lifting platform and an operating handle. The guide rod is arranged between the operating platform and the lifting support platform. The lifting platform is sleeved on the guide rod and is movable back and forth along the guide rod, one end of each locating pin is fixed on the lifting platform. The operating handle controls the lifting platform moving back and forth along the guide rod.

Preferably, further including a calibration platform fixedly connected to the operating platform, the calibration platform is provided with calibration holes matching the number of locating pins, and the locating pins are capable of being be inserted into the corresponding calibration holes to calibrate the deviation between the top and bottom of the locating pins.

Preferably, further including a calibration platform detachably and fixedly connected to the operating platform, the calibration platform is provided with calibration holes matching the number of locating pins, and the bottom of the locating pins are fixed on the operating platform. Inserting the top of the locating pins into the corresponding calibration holes while connecting the operating platform fixedly to the calibration platform, so as to calibrate the deviation between the top and bottom of the locating pins. Disconnecting the operating platform from the calibration platform while separating the locating pins from the calibration platform, so as to separate the operating platform form the calibration platform.

Preferably, a protection plate is further provided on the placement platform formed after the operating platform is fixedly connected to the supporting platform, or a protection plate is further provided on the supporting platform.

Preferably, the supporting platform is provided with a locating slot, and the operating platform is provided with a dowel pin matched with the locating slot. The dowel pin on the operating platform is capable of being inserted into the locating slot on the supporting platform to confirm the connecting location of the supporting platform and the operating platform.

The technical scheme of the present invention further provides a polishing system, including the polishing fixture mentioned above.

Preferably, the polishing system further includes a polishing equipment, including a shelving platform for placing the placement platform; the placement platform is arranged on the polishing fixture and on which the product to be polished is stacked. Wherein, each product to be polished is provided with a locating hole for locating, and a plurality of the products to be polished are stacked on the placement platform of the polishing fixture by stringing the locating holes into the locating pins.

Preferably, separating the locating pins from the locating holes of the product to be polished while disconnecting the supporting platform from the operating platform at the same time, so as to separate the operating platform from the polishing equipment, and the polishing equipment will polish the product to be polished left on the supporting platform.

Advantages of the present invention:

1. The polishing fixture of the present invention includes the supporting platform for stacking up the product to be polished, and further includes the operating platform detachably and fixedly connected to the supporting platform. The operating platform is provided at least two locating pins perpendicular to the top surface of the operating platform, and products with different numbers from dozens to hundreds are capable of being fixed by stringing the locating holes into the locating pins and adjusting the length of the locating pins. The supporting platform and the operating platform are detachably and fixedly connected together to form the placement platform for the product to be polished. After fixing the products, separating the locating pins from the product to be polished, and separating the operating platform from the supporting platform at the same time, to facilitate the polishing equipment polishing the products. Therefore, the polishing equipment is capable of polishing dozens or even hundreds of products at one time, which improves the polishing efficiency and reduces the rejection rate of the polishing products at the same time, and the rejection rate is as low as about three per thousand.

2. In the polishing fixture of the present invention, the locating pins are capable of moving back and forth along the vertical direction of the operating platform through the lifting platform. And after the product to be polished is transferred to the polishing equipment, it is convenient to separate the locating pins and other devices from the product to be polished.

3. The polishing fixture of the present invention can further be provided with calibration platform, which is provided with calibration holes. Inserting the top of the locating pins into the calibration holes is capable of calibrating the deviation between the top and bottom of the locating pins and further reducing the rejection rate of the polishing products.

4. In the polishing fixture of the present invention, a protection plate can be further provided on the placement platform formed after the operating platform is fixedly connected to the supporting platform. The protection plate is made of flexible material, which is capable of protecting the surface of the product to be polished from being destroyed under heavy pressure and further reducing the rejection rate of the polishing products.

5. In the polishing fixture of the present invention, the supporting platform is provided with a locating slot, and the operating platform is provided with a dowel pin matched with the locating slot. The dowel pin on the operating platform is capable of being inserted into the locating slot on the supporting platform to confirm the connecting location of the supporting platform and the operating platform, so as to facilitate the connection between the supporting platform and the operating platform.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a stereoscopic schematic diagram of a polishing fixture provided in the first embodiment of the present invention.

FIG. 2 is an explosion diagram of a polishing fixture provided in the first embodiment of the present invention.

FIG. 3 is a stereoscopic schematic diagram provided in the first embodiment of the present invention, depicting the product to be polished fixed by a polishing fixture.

FIG. 4 is a stereoscopic schematic diagram provided in the second embodiment of the present invention, depicting a polishing fixture of a polishing system is fixed on a polishing equipment.

FIG. 5 is a stereoscopic schematic diagram provided in the second embodiment of the present invention, depicting locating pins of a polishing system are separated from the product to be polished.

FIG. 6 is a schematic diagram of the product to be polished of a polishing system provided in the second embodiment of the present invention.

DESCRIPTION OF THE SPECIFIC EMBODIMENTS

The technical scheme of the present invention is described in detail in combination with FIGS. 1-6 and embodiments, wherein: 100, supporting platform; 101, protection plate; 102, locating slot; 200, operating platform; 201, locating pin; 202, bolt; 203, dowel pin; 300, lifting support platform; 301, lifting platform; 302, guide rod; 303, operating handle; 400, calibration platform; 401, calibration hole; 500, shelving platform; 501, gravity piece; 600, product; 601, locating hole.

Polishing Fixture

In the first embodiment, the present invention provides a polishing fixture to fix together the flaky products to be polished, the products are provided with locating holes and then will be polished by the polishing equipment.

FIG. 1 shows a stereoscopic schematic diagram of a polishing fixture provided in the first embodiment of the present invention, including a supporting platform 100, and an operating platform 200 detachably and fixedly connected to the supporting platform, the operating platform 200 is provided with at least two locating pins 201 perpendicular to the top surface of the operating platform 200. After punching the locating holes in the product to be polished, products with different numbers from dozens to hundreds are capable of being fixed by stringing the locating holes into the locating pins 201 and adjusting the length of the locating pins 201.

FIG. 2 shows an exploded diagram of a polishing fixture provided in the first embodiment of the present invention. As can be seen, the operating platform 200 and the supporting platform 100 are detachably and fixedly connected, and after connected together, the operating platform 200 and the supporting platform 100 form a placement platform for the product to be polished. After fixing the products, separating the operating platform 200 from the supporting platform, and separating the locating pins 201 from the product to be polished 600 at the same time, to facilitate the polishing equipment polishing the products. Therefore, the polishing equipment is capable of polishing dozens or even hundreds of products at one time, which improves the polishing efficiency and reduces the rejection rate of the polishing products at the same time, and the rejection rate is as low as about three per thousand.

Further, there are many ways for the dismountable fixed connection between the operating platform 200 and supporting platform 100, including bolts, buckles, etc. Preferably, this embodiment use bolts because of their convenience in disassembly.

What needs to be illustrated is that there are many ways to connect the locating pins 201 and the operating platform 200 in this embodiment, including fixing the bottom of the locating pins 201 to the operating platform 200; or piercing the locating pins 201 through the operating platform 200, and the locating pins 201 are capable of moving back and forth along the vertical direction of the top surface of the operating platform 200, which is more convenient to separate the locating pins 201 from the products.

Described in a preferred embodiment, the bottom of the operating platform 200 is fixedly connected to a lifting support platform 300 which is provided with a lifting device. One end of each locating pin 201 is fixed on the lifting device, and the other end is threaded through the top surface of the operating platform 200. The lifting device is used to control the locating pins 201 moving back and forth along the vertical direction of the top surface of the operating platform 200, so as to control the height of the locating pins 201 on the operating platform 200.

What needs to be illustrated is that, the number of the lifting device may be only one, and all the locating pins 201 are fixed on the lifting device; or the number of the lifting device may be the same as that of the locating pins, which is more convenient to separate the locating pins 201 from the products.

As a preferred embodiment of the above embodiment, in order to facilitate the separation between the locating pins 201 and products, the number of the lifting device is the same as that of the locating pins 201, namely, each locating pin is configured with one lifting device. In particular, each lifting device includes a guide rod 302, a lifting platform 301 and an operating handle 303. The guide rod 302 is arranged between the operating platform 200 and the lifting support platform 300, the lifting platform 301 is arranged on the guide rod 302 and is capable of moving back and forth along the guide rod 302. One end of each locating pin 201 is fixed on the lifting platform 301, and the operating handle 303 is capable of controlling the lifting platform 301 moving back and forth along the guide rod 302. As shown in FIG. 2, the lifting platform 301 is located at the lowest section of the guide rod 302, and at this point, the locating pin 201 is located at the lowest height on the operating platform 200.

Described in a preferred embodiment, the polishing fixture further includes a calibration platform 400 fixedly connected to the operating platform 200 and provided with calibration holes 401 in the top. Inserting the top of the locating pins 201 into the calibration holes 401 is capable of calibrating the deviation between the top and bottom of the locating pins 201 and further reducing the rejection rate of the polishing products.

Described in a preferred embodiment, a protection plate 101 is further provided between the supporting platform 100 and the product to be polished 600, the protection plate 101 is arranged on the supporting platform 100 or on the placement platform formed by the operating platform 200 and the supporting platform 100. The protection plate 101 is made of flexible material for protecting the surface of the product to be polished 600 from being destroyed under heavy pressure.

Described in a preferred embodiment, as shown in FIG. 5, the supporting platform 100 is provided with locating slots 102, the operating platform 200 is provided with dowel pins 203 matched with the locating slots 102, and the dowel pins 203 on the operating platform 200 are capable of being inserted into the locating slots 102 on the supporting platform 100 to confirm the connecting location of the supporting platform 100 and the operating platform 200.

FIG. 3 shows a stereoscopic schematic diagram provided in the first embodiment of the present invention, depicting the product to be polished fixed by a polishing fixture. Moving the lifting platform 301 up to the top of the guide rod 302, at this time, the locating pins 201 on the operating platform 200 will be at the highest height, and then inserting the top of the locating pins 201 into the calibration holes 401 of the calibration platform 400.

In another embodiment, the polishing fixture of the present invention includes a supporting platform 100, an operating platform 200 and a calibration platform 400, the bottom of the locating pins 201 are fixed on the operating platform 200, and the top of the locating pins 201 are capable of being inserted into the calibration holes 401 of the calibration platform 400, so as to calibrate the deviation between the top and bottom of the locating pins 201. The supporting platform 100 and the operating platform 200 are detachably and fixedly connected, the calibration platform 400 and the operating platform 200 are detachably and fixedly connected. The specific operation process of the polishing fixture is as follow: fixedly connecting the supporting platform 100 with the operating platform 200 to form the placement platform, and stacking up the products to be polished 600 on the placement platform by threading them into the locating pins 201. Then inserting the top of the locating pins 201 into the calibration holes 401 of the calibration platform 400, meanwhile, fixedly connecting the calibration platform 400 with the operating platform 200. When to disconnect the calibration platform 400 from the operating platform 200, moving up the calibration platform 400 to separate the locating pins 201 from the calibration holes 401. When to disconnect the operating platform 200 from the supporting platform 100, moving down the operating platform 200 to separate the locating pins 201 from the products to be polished 600.

Polishing System and Polishing Method

In the second embodiment, the present invention provides a polishing system, which is capable of efficiently polishing the flaky products to be polished provided with locating holes and greatly reducing the rejection rate of the polishing products.

FIG. 4 shows a stereoscopic schematic diagram provided in the second embodiment of the present invention, depicting a polishing fixture of a polishing system is fixed on a polishing equipment.

FIG. 5 shows a stereoscopic schematic diagram provided in the second embodiment of the present invention, depicting locating pins of a polishing system are separated from the product to be polished.

Referring to FIG. 4 and FIG. 5, the polishing system includes a polishing fixture and a polishing equipment. The polishing fixture includes a supporting platform 100, an operating platform 200 detachably and fixedly connected to the supporting platform 100, a lifting support platform 300 fixedly connected to the bottom of the operating platform 200, and a calibration platform 400 fixedly connected to the operating platform 200. Fixedly connecting the supporting platform 100 with the operating platform 200 together to form a placement platform for the products to be polished 600. The operating platform 200 is provided with at least two locating pins 201, and a plurality of the products to be polished 600 are capable of being stacked on the placement platform of the polishing fixture by stringing the locating holes 601 into the locating pins 201. The lifting support platform 300 is provided with lifting device, one end of each locating pin 201 is fixed on the lifting device, and the other end is threaded through the top surface of the operating platform 200. The lifting device is used to control the locating pins 201 moving back and forth along the vertical direction of the operating platform 200, so as to control the height of the locating pins 201 on the operating platform 200. The calibration platform 400 is provided with calibration holes 401 matching the number of locating pins 201, and the locating pins 201 are capable of being driven by the lifting platform and inserted into the corresponding calibration holes 401, so as to calibrate the deviation between the top and bottom of the locating pins 201.

Please continuously refer to FIG. 4, the polishing equipment includes shelving platform 500, on which the bottom of the supporting platform 100 of the polishing fixture is placed, and the products to be polished 600 are stacked on the supporting platform 100. Moving down the locating pins 201 along the vertical direction of the operating platform 200 through the lifting device, the locating pins 201 will be separated from the locating holes 601 of the products to be polished 600, and the fixed connection between the supporting platform 100 and the operating platform 200 will be released to separate the operating platform 200 from the polishing equipment. Meanwhile, the supporting platform 100 will be left on the shelving platform 500 of the polishing equipment, and the polishing equipment will polish the product to be polished left on the supporting platform 100.

The polishing fixture in the second embodiment of the present invention is the same as that in the first embodiment of the present invention. The polishing fixture is not described again since the specific structure and working process of the polishing fixture have been already described respectively in detail, please refer to related description in the first embodiment and FIG. 1 to FIG. 3.

In addition, what needs to be illustrated is that the internal components of the polishing fixture will not be described one by one in the following description, please directly refer to related description in the first embodiment and FIG. 1 to FIG. 3 for the relevant content.

In the second embodiment, the present invention further provides a polishing method of the polishing system, including the following steps:

providing the product to be polished with locating holes arranged on it;

providing the polishing fixture with locating pins and calibration platform arranged on it, the calibration platform is provided with calibration holes;

providing polishing equipment with shelving platform arranged on it.

Fixing the product to be polished on the locating pins of the polishing fixture through the locating holes.

Repeating the fixing process of the product to be polished until all the products are fixed, then adjusting and inserting the locating pins into the calibration holes of the calibration platform.

Fixing the polishing fixture on the shelving platform of the polishing equipment.

Separating locating pins of the polishing fixture from the product to be polished, releasing the fixed connection between the operating platform and the supporting platform to separate the operating platform from the supporting platform, and leaving the supporting platform on the shelving platform of the polishing equipment.

Polishing the product to be polished left on the supporting platform by using the polishing equipment.

What needs to be illustrated is that, before the product to be polished is fixed on the locating pins, a protection plate 101 made of flexible material can be provided to protect the surface of the product to be polished from being destroyed under heavy pressure.

In addition, the action of fixing the product to be polished on the locating pins of the polishing fixture through the locating holes can be performed directly on the shelving platform, or preferably, it can also be performed in other places. And then, transferring the fixed product to the shelving platform 500 of the polishing equipment, which can reduce the vacancy rate of the polishing equipment and further improve the polishing efficiency of the polishing equipment.

What needs to be illustrated is that, there are various method for fixing the polishing fixture on the shelving platform of the polishing equipment, and in this embodiment, heavy pressure is preferred for fixing the polishing fixture. As shown in FIG. 4, arranging the protection plate 101 on the product to be polished, and then arranging a gravity piece 501 on the protection plate 101 to fix the product to be polished and prevent the product to be polished from shifting when the locating pins are removed.

The foregoing are merely the preferred embodiments of the present invention, but not intended to limit the patent scope of the invention. Any equivalent structure or equivalent procedure transformation made by means of the description and the attached drawings of the present invention, or directly or indirectly operating in other relevant arts shall pertain to the scope of patent protection of the present invention. 

1. A polishing fixture, including a supporting platform, characterized in that: further including an operating platform detachably and fixedly connected to the supporting platform, the operating platform includes at least two locating pins, the supporting platform and the operating platform are fixedly connected together to form a placement platform for a product to be polished.
 2. The polishing fixture as described in claim 1, characterized in that: further including a lifting support platform fixedly connected to the bottom of the operating platform, and a lifting device arranged on the lifting support platform; the lifting device is used to control the locating pins moving back and forth along the vertical direction of the operating platform, so as to control the height of the locating pins on the operating platform; one end of each locating pin is fixed on the lifting device, and the other end is threaded through the top surface of the operating platform.
 3. The polishing fixture as described in claim 2, characterized in that: the lifting device includes a guide rod, a lifting platform and an operating handle; the guide rod is arranged between the operating platform and the lifting support platform; the lifting platform is sleeved on the guide rod and is movable back and forth along the guide rod, one end of each locating pin is fixed on the lifting platform; the operating handle controls the lifting platform moving back and forth along the guide rod.
 4. The polishing fixture as described in claim 1, characterized in that: further including a calibration platform fixedly connected to the operating platform, the calibration platform is provided with calibration holes matching the number of locating pins, and the locating pins are capable of being inserted into the corresponding calibration holes to calibrate the deviation between the top and bottom of the locating pins.
 5. The polishing fixture as described in claim 1, characterized in that: further including a calibration platform detachably and fixedly connected to the operating platform, the calibration platform is provided with calibration holes matching the number of locating pins, and the bottom of the locating pins are fixed on the operating platform; inserting the top of the locating pins into the corresponding calibration holes while connecting the operating platform fixedly to the calibration platform, so as to calibrate the deviation between the top and bottom of the locating pins; disconnecting the operating platform from the calibration platform while separating the locating pins from the calibration platform, so as to separate the operating platform form the calibration platform.
 6. The polishing fixture as described in claim 1, characterized in that: a protection plate is further provided on the placement platform formed after the operating platform is fixedly connected to the supporting platform, or a protection plate is further provided on the supporting platform.
 7. The polishing fixture as described in claim 1, characterized in that: the supporting platform is provided with a locating slot, and the operating platform is provided with a dowel pin matched with the locating slot; the dowel pin on the operating platform is capable of being inserted into the locating slot on the supporting platform to confirm the connecting location of the supporting platform and the operating platform.
 8. A polishing system, characterized in that: including the polishing fixture as described in claim
 1. 9. The polishing system as described in claim 8, characterized in that: the polishing system further includes a polishing equipment, including a shelving platform for placing the placement platform on which the product to be polished is stacked; wherein, each product to be polished is provided with a locating hole for locating, and a plurality of the products to be polished are stacked on the placement platform of the polishing fixture by stringing the locating holes into the locating pins.
 10. The polishing system as described in claim 9, characterized in that: separating the locating pins from the locating holes of the product to be polished while disconnecting the supporting platform from the operating platform, so as to separate the operating platform from the polishing equipment, and the polishing equipment will polish the product to be polished left on the supporting platform. 